Helios SCAN-tn / LAB-tn / INLINE-tn
Off-/Inline: Thickness and refractive index of coatings
Helios LAB-rc
Offline: Texture and coating control
ETA-XiTo
Inline: Thickness of liquids on rough surfaces
ETA-RT
Offline: Physical tester for all disc formats including BD
ETA-GTII / ETA-GTII Blue
Offline: Geometrical tester for all disc formats incl. BD
ETA-Scanner / ETA-CD-I
Inline: Defect inspection / Physical test of optical discs
Xelas LAB-tfs
Offline: Layer thicknesses and n&k
Xelas SCAN-tfs
Offline: Layer thicknesses and n&k mappings
Xelas INLINE-tfs
Inline: Thin film thicknesses of solar cells
ETA-TCM-R
Inline: Reflectance and layer thickness
ETA-TCM-T
Inline: Transmittance and color
ETA-TCM-OD
Inline: Optical density
Xelas INLINE-oled
Inline: Thicknesses of organic and ITO layers
Xelas LAB-oled
Offline: OLED layer thicknesses and n&k
Xelas SCAN-oled
Offline: OLED layer thicknesses and n&k mappings
ETA-SST
Offline: Reflectance and layer thickness
ETA-CSS
Offline: Transmittance and color
ETA-ARC / ETA-ARC-AT
Offline: Reflectance and coating control on curved surfaces